College Catalog
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Course Descriptions
QAL221
Statistical Methods for Nanofabrication Processing
This course will develop skills and knowledge in basic statistical methods as applied in the semiconductor processing industry. This course provides a basic introduction to the concepts of continual process improvement, the Deming management philosophy, statistical process control (SPC), and other process improvement philosophies. Also, issues of yield, reliability, and design of experiments to test quality parameters will focus on problem solving skills. Justification and cost benefit will be tied to process, procedure, and techniques to encounter a wide range of quality issues and problems encountered in the semiconductor processing industry. 4 Credits (3 Lecture - 3 Lab)
Prerequisite(s): MTH182. Corequisite(s): CSC110.