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Statistical Methods for Nanofabrication Processing

QAL221

Basic statistical methods as applied in the semiconductor processing industry. Course work provides a basic introduction to the concepts of continual process improvement, the Deming management philosophy, statistical process control (SPC), and other process improvement philosophies. Also, issues of yield, reliability, and design of experiments to test quality parameters focus on problem solving skills. Justification and cost benefit are tied to process, procedure, and techniques to encounter a wide range of quality issues and problems encountered in the semiconductor processing industry. 4 Credits (3 Lecture - 3 Lab) Prerequisite(s): MTH182. Corequisite(s): CSC110 or CSC124.